Noise-resilient deep learning for integrated circuit tomography
Published in Optics Express, 2023
Z. Guo+, Z. Liu+, G. Barbastathis*, Q. Zhang, M. E. Glinsky, B. K. Alpert, and Z. H. Levine*. "Noise-resilient deep learning for integrated circuit tomography." Optics Expres. 31, 10 (2023).
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